Solartron metrology offer solution for critical flatness feature in Electronics and Automotive components. Everything from Cell Phone glass to semi-conductor wafers may carry sub-micron tolerances for flatness. For this, several points over a small surface area must be checked, with a high accuracy being a key feature.
- Class leading resolution of down to 0.01µm
- Repeatability of up to 0.015µm
- Low tip forces
- Measure Multiple points easy.
- Lower cost
