Electrical noise or cross talk can have a significant negative effect to both Non Repeat and Accuracy when using any conventional
LVDT or Half Bridge Gauging Probe.
Noise levels are often related to the number of probes installed and can have a significant effect on gauge R&R.
Solartron Metrology takes special care to ensure that with it's shielded construction, it's
Analogue Gauging Probes are as immune as possible to external electrical interference. However, as a component no LVDT or Half Bridge Gauging Probe can, on it's own, obtain
CE certification for noise immunity or emission.
It is the responsibility of the system builder to obtain
CE certification for any complete system that incorporates Analogue Gauging probes.
Solartron Metrology’s
Orbit® Network and Digital Gauging Probes provide improved Gauge R&R through cleaner signals and better electrical noise immunity:
Solartron Digital Probes Conform to EN 61000-6-2 and have been independently approved for CE certification.